# Introduction to Basic Statistical Process Control

Statistical Process Control (SPC) is a proven and effective technique that helps teams and organizations monitor critical process outputs and drive continuous performance. Learning how to correctly collect process data and then how to properly construct and interpret control charts is required to compete in today’s worldwide marketplace.

The objective of this two-day course is to introduce the formulas, statistical symbols, terminology and interpretation of basic SPC while using hands-on examples. This is a good course for those who have never been exposed to control charts. The use and interpretation of control charts are emphasized while formulas and statistical theory are expanded.

## Who Should Attend

Everyone who needs to develop process monitoring methods using data collection, control charts and data interpretation in order to drive process improvement and meet customers’ increasingly higher demands for top-notch quality. Participants include quality managers, quality engineers, manufacturing engineers, product engineers, supervisors, inspectors, maintenance personnel and machine operators.

## Benefits and Learning Outcomes

• Correctly apply control charts to most manufacturing processes
• Accurately interpret these charts to quickly detect any changes in process output
• Stabilize a process to produce consistent parts that satisfy customers

## Course Outline/Topics

Topics covered in this overview include:

• Concept of variation in manufacturing
• Histograms and the normal distribution
• Calculating process parameters: population average and standard deviation
• Calculating subgroup statistics: subgroup average, range and standard deviation
• Plotting subgroup statistics on a control chart
• Estimating process parameters from subgroup statistics
• The power of control charts and why they’re better than inspection
• Developing control limits for the X-bar,R chart and the IX & MR chart
• Interpreting charts for stability: points outside of a control limit, runs, trends and cycles
• Determining rational subgroups, selecting an appropriate subgroup size, finding the suitable time between collecting subgroups and knowing when to update control limits
• When to leave the process alone and when to adjust
• Difference between specification limits and control limits
• The difference between attribute data and variable data
• c,u,np, and charts for attribute data
• Conducting a capability study
• The CR, CP, CPL, CPU, and CPK capability indexes

Dates and locations to be announced.