UHV Scanning Tunneling and Non-contact Atomic Force Microscopy

UHV Tunneling and Non-contact Atomic Force Microscopy

Our lab is equipped with one Omicron variable-temperature Scanning Tunneling Microscope (STM) operating from 25 to 1500 K, and one low-temperature STM (5-300 K) with a q-plus sensor for non-contact atomic force microscopy (AFM). The combination of QPlus AFM and STM has a tremendous potential for a range of applications, including AFM-based single molecule manipulation on insulating surfaces and single molecule force probing.

Samples can be transferred from the molecular beam epitaxy (MBE) growth chamber, via the R2P2 (a multi-exit radial distribution system) to STM chambers without exposure to the atmosphere.